TITLE

Single-electron manipulation to and from a SiO2 surface by electrostatic force microscopy

AUTHOR(S)
Bussmann, E.; Zheng, N.; Williams, C. C.
PUB. DATE
April 2005
SOURCE
Applied Physics Letters;4/18/2005, Vol. 86 Issue 16, p163109
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Occupation of individual electron states near the surface of a SiO2 film is controlled by reversible single-electron tunneling to or from a metallic electrostatic force microscope probe. By switching the polarity of an applied dc bias between the probe and the sample to adjust the Fermi energy of the probe with respect to states near the dielectric surface, individual electrons are repeatably manipulated in and out of the sample. The single-electron charging and discharging is detected by frequency detection electrostatic force microscopy.
ACCESSION #
17227479

 

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