TITLE

Charging efficiency and lifetime of image-bound electrons on a dielectric surface

AUTHOR(S)
Biasini, M.; Gann, R. D.; Yarmoff, J. A.; Mills, A. P.; Pfeiffer, L. N.; West, K. W.; Gao, X. P. A.; Williams, B. C. D.
PUB. DATE
April 2005
SOURCE
Applied Physics Letters;4/18/2005, Vol. 86 Issue 16, p162111
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The surface charge generated on an Al0.24Ga0.76As/GaAs quantum well sample by electron bombardment was monitored by measuring the change in the conductivity of the channel. Upon turning off the electron bombardment the surface charge on adsorbed layers of xenon and water at 8 K decays in room temperature darkness with a lifetime τ=0.30±0.02 s. The average charging efficiency, μ0, defined as the ratio of the charge collected by the surface to the beam current times the charging time, is μ0≃0.001. Surface charging proves to be an effective method for contactless gating of field effect devices.
ACCESSION #
17227470

 

Related Articles

  • High-brightness source for ion and electron beams (invited). Kalbitzer, S.; Knoblauch, A. // Review of Scientific Instruments;Feb1998, Vol. 69 Issue 2, p1026 

    Investigates the emission of ion and electron beams from tungsten and iridium. Comparison of the brightness values between high-brightness sources and other sources of charged particle emission; Estimation of the limiting image size using the source properties; Consideration of ion beam...

  • Effect of nonlocal electron kinetics on the characteristics of a dielectric barrier discharge in xenon. Avtaeva, S.; Skornyakov, A. // Plasma Physics Reports;Jul2009, Vol. 35 Issue 7, p593 

    The established dynamics of a dielectric barrier discharge in xenon at a pressure of 400 Torr is simulated in the framework of a one-dimensional fluid model in the local and nonlocal field approximations. It is shown that taking into account the nonlocal character of the electric field does not...

  • Energy Distributions of Secondary Electrons Under Different Conditions. Žilaý, P.; Pavlů, J.; Němeček, Z.; Šafr&a#x00E1;nková, J. // AIP Conference Proceedings;2005, Vol. 799 Issue 1, p391 

    Secondary emission invoked by energetic electrons can charge dust grains either positively or negatively depending on the grain size, secondary emission yield and electron energy. Emission properties of the grain surface depend on grain’s charging history (the impact of energetic ions...

  • Comparison of experimental data and three-dimensional simulations of ion beam neutralization from the Neutralized Transport Experiment. Thoma, C.; Welch, D. R.; Yu, S. S.; Henestroza, E.; Roy, P. K.; Eylon, S.; Gilson, E. P. // Physics of Plasmas;Apr2005, Vol. 12 Issue 4, p043102 

    The Neutralized Transport Experiment at Lawrence Berkeley National Laboratory has been designed to study the final focus and neutralization of high perveance ion beams [E. Henestroza, S. Eylon, P. Roy, S. Yu, A. Anders, F. Bieniosek, W. Greenway, B. Logan, R. MacGill, D. Shuman et al., Phys....

  • Escape depth of secondary electrons induced by ion irradiation of submicron diamond membranes. Richter, V.; Fizgeer, B.; Michaelson, Sh.; Hoffman, A.; Kalish, R. // Journal of Applied Physics;11/15/2004, Vol. 96 Issue 10, p5824 

    The emission of secondary electrons from any material is governed by electron excitation in the bulk, their transport to the surface, and their escape through the surface into the vacuum. Here, we address the question of the transport of electrons in polycrystalline diamond and amorphous carbon...

  • Thermal stability of Co/SiO2 multilayers for use in the soft x-ray region. Ishino, Masahiko; Koike, Masato; Kanehira, Mika; Satou, Futami; Terauchi, Masami; Sano, Kazuo // Journal of Applied Physics;7/15/2007, Vol. 102 Issue 2, p023513 

    The thermal stability of Co/SiO2 multilayers was evaluated. Multilayer samples were deposited on Si substrates by means of the ion beam sputtering method and annealed at temperatures from 100 °C to 600 °C in a vacuum furnace. For the structural and optical evaluations, small-angle x-ray...

  • Electrostatic ion beam trap for electron collision studies. Heber, O.; Witte, P. D.; Diner, A.; Bhushan, K. G.; Strasser, D.; Toker, Y.; Rappaport, M. L.; Ben-Itzhak, I.; Altstein, N.; Schwalm, D.; Wolf, A.; Zajfman, D. // Review of Scientific Instruments;Jan2005, Vol. 76 Issue 1, p013104 

    We describe a system combining an ion beam trap and a low energy electron target in which the interaction between electrons and vibrationally cold molecular ions and clusters can be studied. The entire system uses only electrostatic fields for both trapping and focusing, thus being able to store...

  • Minimizing quasiparticle generation from stray infrared light in superconducting quantum circuits. Barends, R.; Wenner, J.; Lenander, M.; Chen, Y.; Bialczak, R. C.; Kelly, J.; Lucero, E.; O'Malley, P.; Mariantoni, M.; Sank, D.; Wang, H.; White, T. C.; Yin, Y.; Zhao, J.; Cleland, A. N.; Martinis, John M.; Baselmans, J. J. A. // Applied Physics Letters;9/12/2011, Vol. 99 Issue 11, p113507 

    We find that quasiparticle generation from stray infrared light creates a significant loss mechanism in superconducting resonators and qubits. We show that resonator quality factors and qubit energy relaxation times are limited by a quasiparticle density of approximately 200 μm-3, induced by...

  • Shift of peak energy distribution in field-emitted charged particle beams. Uhm, Han S.; Choi, E.H.; Cho, G.S.; Kang, S.O. // Physics of Plasmas;Dec94, Vol. 1 Issue 12, p4105 

    Discusses the development of a theoretical model for energy spread and shift of peak energy distribution in an ion beam. Radial expansion of beam with downstream propagation; Different potentials of charged particles placed randomly in the beam; Proportion of the shift of peak energy...

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics