Near-field and far-field dynamics of (Al,In)GaN laser diodes

Schwarz, Ulrich T.; Pindl, Markus; Wegscheider, Werner; Eichler, Christoph; Scholz, Ferdinand; Furitsch, Michael; Leber, Andreas; Miller, Stephan; Lell, Alfred; Härle, Volker
April 2005
Applied Physics Letters;4/18/2005, Vol. 86 Issue 16, p161112
Academic Journal
Near- and far-field dynamics of edge-emitting (Al,In)GaN laser diodes are measured simultaneously with a 100 nm spatial and a 5 ns temporal resolution using a scanning near-field microscope. We reconstruct the phase distribution at the laser diode facet. Beam steering and near-field mode dynamics are interpreted in terms of thermal and carrier induced change of refractive index in the waveguide.


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