A different way of performing picosecond ultrasonic measurements in thin transparent films based on laser-wavelength effects

Devos, A.; Côte, R.; Caruyer, G.; Lefèvre, A.
May 2005
Applied Physics Letters;5/23/2005, Vol. 86 Issue 21, p211903
Academic Journal
We present a way of using picosecond ultrasonics to simultaneously get the thickness and elastic properties of thin dielectric layers. This is based on the use of a blue probe which is shown to improve the detection of acousto-optic oscillations in the dielectric from which the sound velocity can be measured from the refractive index. At the same wavelength a strong response of the silicon is used to detect the arrival of the acoustic pulse. We apply this scheme to various materials deposited on silicon substrates.


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