Optical loss and lasing characteristics of high-quality-factor AlGaAs microdisk resonators with embedded quantum dots

Srinivasan, Kartik; Borselli, Matthew; Johnson, Thomas J.; Barclay, Paul E.; Painter, Oskar; Stintz, Andreas; Krishna, Sanjay
April 2005
Applied Physics Letters;4/11/2005, Vol. 86 Issue 15, p151106
Academic Journal
Optical characterization of AlGaAs microdisk resonant cavities with a quantum dot active region is presented. Direct passive measurement of the optical loss within AlGaAs microdisk resonant structures embedded with InAs/InGaAs dots-in-a-well (DWELL) is performed using an optical-fiber-based probing technique at a wavelength (λ∼1.4 μm) that is red detuned from the dot emission wavelength (λ∼1.2 μm). Measurements in the 1.4 μm wavelength band on microdisks of diameter D=4.5 μm show that these structures support modes with cold-cavity quality factors as high as 3.6×105. DWELL-containing microdisks are then studied through optical pumping at room temperature. Pulsed lasing at λ∼1.2 μm is seen for cavities containing a single layer of InAs dots, with threshold values of ∼17 μW, approaching the estimated material transparency level. Room-temperature continuous-wave operation is also observed.


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