Study of orientation effect on nanoscale polarization in BaTiO3 thin films using piezoresponse force microscopy

Il-Doo Kim; Avrahami, Ytshak; Tuller, Harry L.; Young-Bae Park; Dicken, Matthew J.; Atwater, Harry A.
May 2005
Applied Physics Letters;5/9/2005, Vol. 86 Issue 19, p192907
Academic Journal
We have investigated the effect of texture on in-plane (IPP) and out-of plane (OPP) polarizations of pulsed-laser-deposited BaTiO3 thin films grown on Pt and La0.5Sr0.5CoO3 (LSCO) buffered Pt electrodes. The OPP and IPP polarizations were observed by piezoresponse force microscopy (PFM) for three-dimensional polarization analyses in conjunction with conventional diffraction methods using x-ray diffraction and reflection high energy electron diffraction measurements. BaTiO3 films grown on Pt electrodes exhibited highly (101) preferred orientation with higher IPP component whereas BaTiO3 film grown on LSCO/Pt electrodes showed (001) and (101) orientations with higher OPP component. Measured effective d33 values of BaTiO3 films deposited on Pt and LSCO/Pt electrodes were 14.3 and 54.0 pm/V, respectively. Local piezoelectric strain loops obtained by OPP and IPP-PFM showed that piezoelectric properties were strongly related to film orientation.


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