Application of Tandem Techniques with Contact Mono-Elements or Phased Array Probes: Simulation and Experiments

Raillon, R.; Lozev, M.; Spencer, R.; Kerbrat, E.; Mahaut, S.
April 2005
AIP Conference Proceedings;2005, Vol. 760 Issue 1, p914
Conference Proceeding
Ultrasonic tandem inspection techniques are widely used to detect midwall defects. Conventionally, a pair of probes scans the specimen, one transducer at transmission, one at reception. An alternative application relies on the selection of different elements over an array, some at transmission, others at reception. Simulation tools for tandem inspection have been integrated into the Civa software developed at CEA, with support from EWI. This paper presents some simulation examples for contact monolithic and phased arrays probes. © 2005 American Institute of Physics


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