Stable and erasable patterning of vanadium pentoxide thin films by atomic force microscope nanolithography

Iwanaga, Shiho; Darling, R. B.; Cobden, D. H.
March 2005
Applied Physics Letters;3/28/2005, Vol. 86 Issue 13, p133113
Academic Journal
Long lasting colored pattern formation on sol–gel deposited vanadium pentoxide (V2O5) thin films is demonstrated by atomic force microscope (AFM) nanolithography. The films can be locally colorized by application of a positive dc bias voltage on the conductive AFM tip. The patterns can be erased, or “bleached,” by application of a negative bias voltage. The changes in optical reflectivity, topography, and conductivity measurements made on as-deposited, colored, and bleached areas were consistent with a model in which the incorporation of hydrogen ions into V2O5 thin films is responsible for the coloration process.


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