Epitaxial nature and anisotropic dielectric properties of (Pb,Sr)TiO3 thin films on NdGaO3 substrates

Lin, Y.; Chen, X.; Liu, S. W.; Chen, C. L.; Lee, Jang-Sik; Li, Y.; Jia, Q. X.; Bhalla, A.
April 2005
Applied Physics Letters;4/4/2005, Vol. 86 Issue 14, p142902
Academic Journal
Epitaxial behavior of (Pb,Sr)TiO3 thin films on (110) NdGaO3 substrates fabricated in different conditions have been investigated using high resolution x-ray diffraction and characterized with interdigital dielectric measurement. A slow cooling results in films with a-axis normal to the surface (a-axis growth), whereas a fast cooling leads to growth of c-axis oriented films. The dielectric properties of the films prepared under different cooling rates are closely related to the crystalline structure of the films.


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