Single-crystal Ti2AlN thin films

Joelsson, T.; Hörling, A.; Birch, J.; Hultman, L.
March 2005
Applied Physics Letters;3/14/2005, Vol. 86 Issue 11, p111913
Academic Journal
We have produced pure thin-film single-crystal Ti2AlN(0001), a member of the Mn+1AXn class of materials. The method used was UHV dc reactive magnetron sputtering from a 2Ti:Al compound target in a mixed Ar–N2 discharge onto (111) oriented MgO substrates. X-ray diffraction and transmission electron microscopy were used to establish the hexagonal crystal structure with c and a lattice parameters of 13.6 and 3.07 Å, respectively. The hardness H, and elastic modulus E, as determined by nanoindentation measurements, were found to be 16.1±1 GPa and 270±20 GPa, respectively. A room-temperature resistivity for the films of 39 μΩ cm was obtained.


Related Articles

  • Deposition of epitaxial Ti2AlC thin films by pulsed cathodic arc. Rosén, J.; Ryves, L.; Persson, P. O. Å.; Bilek, M. M. M. // Journal of Applied Physics;3/1/2007, Vol. 101 Issue 5, p056101 

    A multicathode high current pulsed cathodic arc has been used to deposit Ti2AlC thin films belonging to the group of nanolaminate ternary compounds of composition Mn+1AXn. The required stoichiometry was achieved by means of alternating plasma pulses from three independent cathodes. We present...

  • Synthesis and ferroelectric properties of epitaxial BiFeO3 thin films grown by sputtering. Das, R. R.; Kim, D. M.; Baek, S. H.; Eom, C. B.; Zavaliche, F.; Yang, S. Y.; Ramesh, R.; Chen, Y. B.; Pan, X. Q.; Ke, X.; Rzchowski, M. S.; Streiffer, S. K. // Applied Physics Letters;6/12/2006, Vol. 88 Issue 24, p242904 

    We have grown epitaxial BiFeO3 thin films with smooth surfaces on (001), (101), and (111) SrTiO3 substrates using sputtering. Four-circle x-ray diffraction and cross-sectional transmission electron microscopy show that the BiFeO3 thin films have rhombohedral symmetry although small monoclinic...

  • In situ growth of c-axis-oriented Ca3Co4O9 thin films on Si (100). Hu, Y. F.; Si, W. D.; Sutter, E.; Li, Qiang // Applied Physics Letters;2/21/2005, Vol. 86 Issue 8, p082103 

    High-quality c-axis-oriented Ca3Co4O9 thin films have been grown directly on Si (100) wafers by pulsed-laser deposition without prechemical treatment of the substrate surface. Cross-sectional transmission electron microscopy shows good crystallinity of the Ca3Co4O9 films. The Seebeck coefficient...

  • Hydrogen-induced atomic deformation in SrBi2Nb2O9 perovskite structure. Ik Soo Kim; In-Hoon Choi; Yong Tae Kim; Seong-Il Kim; Dong Chul Yoo; Jeong Yong Lee // Applied Physics Letters;11/1/2004, Vol. 85 Issue 18, p4037 

    The origin of hydrogen-induced structural deformation of ferroelectric SrBi2Nb2O9 (SBN) thin films is investigated by annealing in forming gas (3% H2–97% N2). High resolution transmission electron microscopy and fast Fourier transformation analysis reveal that the {115} planes are shifted...

  • Ba0.5Sr0.5TiO3–Bi1.5Zn1.0Nb1.5O7 composite thin films with promising microwave dielectric properties for microwave device applications. Yan, L.; Kong, L.B.; Chen, L.F.; Chong, K.B.; Tan, C.Y.; Ong, C.K. // Applied Physics Letters;10/18/2004, Vol. 85 Issue 16, p3522 

    Crack-free, dense, and uniform Ba0.5Sr0.5TiO3(BST)–Bi1.5Zn1.0Nb1.5O7(BZN) composite thin films were deposited on (100) LaAlO3, (100) SrTiO3, and (100) MgO substrates via a pulsed laser deposition, using a combined target of BST and BZN ceramics. Phase composition and microstructure of the...

  • Direct structural evidences of Mn11Ge8 and Mn5Ge2 clusters in Ge0.96Mn0.04 thin films. Yong Wang; Jin Zou; Zuoming Zhao; Xinhai Han; Xiaoyu Zhou; Wang, Kang L. // Applied Physics Letters;3/10/2008, Vol. 92 Issue 10, p101913 

    Mn-rich clusters in Mn-doped Ge thin films epitaxially grown on Ge (001) have been investigated by various transmission electron microscopy techniques. Both the mysterious Mn11Ge8 and the hexagonal Mn5Ge2 (a=0.72 nm and c=1.3 nm) clusters were confirmed to coexist in the thicker Ge0.96Mn0.04...

  • Structural and magnetic properties of Nd0.7Ce0.3MnO3 thin films. Yanagida, Takeshi; Kanki, Teruo; Vilquin, Bertrand; Tanaka, Hidekazu; Kawai, Tomoji // Journal of Applied Physics;3/1/2006, Vol. 99 Issue 5, p053908 

    This paper reports on the structural and magnetic properties of Nd0.7Ce0.3MnO3 (NCeMO) epitaxial thin films lacking Ce-rich impurities with the intention being to investigate the effect of ionic radius of the A site cation on the microstructures and magnetic properties in comparison with...

  • Effect of anisotropic strain on the charge ordering behavior in Bi0.4Ca0.6MnO3 films. Ding, Y. H.; Wang, Y. Q.; Cai, R. S.; Chen, Y. Z.; Sun, J. R. // Applied Physics Letters;11/7/2011, Vol. 99 Issue 19, p191914 

    Anisotropic strain has a significant influence on the charge ordering (CO) behavior in Bi0.4Ca0.6MnO3 (BCMO) films on (110) SrTiO3 substrates. Effect of film thickness on the CO behavior in BCMO films was investigated at 103 K using transmission electron microscopy. It was found that the film...

  • Microstructure and electrical properties of (120)O-oriented and of (001)O-oriented epitaxial antiferroelectric PbZrO3 thin films on (100) SrTiO3 substrates covered with different oxide bottom electrodes. Boldyreva, Ksenia; Bao, Dinghua; Le Rhun, Gwenael; Pintilie, Lucian; Alexe, Marin; Hesse, Dietrich // Journal of Applied Physics;8/15/2007, Vol. 102 Issue 4, p044111 

    Epitaxial antiferroelectric PbZrO3 (PZO) thin films of two different crystallographic orientations were grown by pulsed laser deposition on (100)-oriented SrTiO3 single crystal substrates. The latter were covered either with SrRuO3 epitaxial bottom electrodes, or with an epitaxial BaZrO3 buffer...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics