In situ resistance measurement of the p-type contact in InP–InGaAsP coolerless ridge waveguide lasers

Kuntze, S. B.; Sargent, E. H.; White, J. K.; Hinzer, K.; Dixon-Warren, St. J.; Ban, D.
February 2005
Applied Physics Letters;2/21/2005, Vol. 86 Issue 8, p081111
Academic Journal
Scanning voltage microscopy (SVM) is employed to measure the voltage division—and resulting contact resistance and power loss—at the p-In0.53Ga0.47As–p-InP heterojunction in a working InP–InGaAsP laser diode. This heterojunction is observed to dissipate ∼35% of the total power applied to the laser over the operating bias range. This in situ experimental study of the parasitic voltage division (and resulting power loss and series contact resistance) highlights the need for a good p-type contact strategy. SVM technique provides a direct, fast and in situ measurement of specific contact resistance, an important device parameter.


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