TITLE

An ESS system for ECRIS Emittance Research

AUTHOR(S)
Cao, Y.; Sun, L. T.; He, W.; Ma, L.; Zhang, Z. M.; Zhao, H. Y.; Zhao, H. W.; Zhang, X. Z.; Guo, X. H.; Ma, B. H.; Li, J.; Wang, H.; Li, J. Y.; Li, X. X.; Feng, Y. C.; Lu, W.
PUB. DATE
March 2005
SOURCE
AIP Conference Proceedings;2005, Vol. 749 Issue 1, p231
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
An emittance scanner named Electric-Sweep Scanner had been designed and fabricated in IMP. And it has been set up on the LECR3 beam line for the ion beam quality study. With some development, the ESS system has become a relatively dependable and reliable emittance scanner. Its experiment error is about 10 percent. We have done a lot of experiments of emittance measurement on LECR3 ion source, and have researched the relations between ion beam emittance and the major parameters of ECR ion source. The reliability and accuracy test results are presented in this paper. And the performance analysis is also discussed. © 2005 American Institute of Physics
ACCESSION #
16436453

 

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