X-ray wavefront analysis and optics characterization with a grating interferometer

Weitkamp, Timm; Nöhammer, Bernd; Diaz, Ana; David, Christian; Ziegler, Eric
January 2005
Applied Physics Letters;1/31/2005, Vol. 86 Issue 5, p054101
Academic Journal
We present an interferometric method to measure the shape of a hard-x-ray wavefront. The interferometer consists of a phase grating as a beam splitter and an absorption grating as a transmission mask for the detector. The device can be used to measure wavefront shape gradients corresponding to radii of curvature as large as several dozens of meters, with a lateral resolution of a few microns. This corresponds to detected wavefront distortions of approximately 10-12 m or λ/100. The device was used with 12.4 keV x rays to measure the slope error and height profile of an x-ray mirror. Surface slope variations with periods ranging from less than 1 mm to more than 1 m can be detected with an accuracy better than 0.1 μrad.


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