Precision cutting of nanotubes with a low-energy electron beam

Yuzvinsky, T. D.; Fennimore, A. M.; Mickelson, W.; Esquivias, C.; Zettl, A.
January 2005
Applied Physics Letters;1/31/2005, Vol. 86 Issue 5, p053109
Academic Journal
We report on a method to locally remove material from carbon and boron nitride nanotubes using the low-energy focused electron beam of a scanning electron microscope. Using this method, clean precise cuts can be made into nanotubes, either part-way through (creating hingelike geometries) or fully through (creating size-selected nanotube segments). This cutting mechanism involves foreign molecular species and differs from electron-beam-induced knock-on damage in transmission electron microscopy.


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