A mechanical microscope: High-speed atomic force microscopy

Humphris, A. D. L.; Miles, M. J.; Hobbs, J. K.
January 2005
Applied Physics Letters;1/17/2005, Vol. 86 Issue 3, p034106
Academic Journal
An atomic force microscope capable of obtaining images in less than 20 ms is presented. By utilizing a microresonator as a scan stage, and through the implementation of a passive mechanical feedback loop with a bandwidth of more than 2 MHz, a 1000-fold increase in image acquisition rate relative to a conventional atomic force microscope is obtained. This has allowed images of soft crystalline and molten polymer surfaces to be collected in 14.3 ms, with a tip velocity of 22.4 cm s-1 while maintaining nanometer resolution.


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