TITLE

New dimension in nano-imaging: breaking through the diffraction limit with scanning near-field optical microscopy

AUTHOR(S)
Rasmussen, Akiko; Deckert, Volker
PUB. DATE
January 2005
SOURCE
Analytical & Bioanalytical Chemistry;Jan2005, Vol. 381 Issue 1, p165
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
In recent years scanning near-field optical microscopy (SNOM) has developed into a powerful surface analytical technique for observing specimens with lateral resolution equal to or even better than 100 nm. A large number of applications, from material science to biology, have been reported. In this paper, two different kinds of near-field optical microscopy, aperture and scattering-type SNOM, are reviewed together with recent studies in surface analysis and biology. Here, near-field optical techniques are discussed in comparison with related methods, such as scanning probe and standard optical microscopy, with respect to their specific advantages and fields of application.
ACCESSION #
16004448

 

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