Interwall support in double-walled carbon nanotubes studied by scanning tunneling microscopy

Park, Min Hwan; Jang, Jae Won; Lee, Cheol Eui; Lee, Cheol Jin
January 2005
Applied Physics Letters;1/10/2005, Vol. 86 Issue 2, p023110
Academic Journal
Atomically resolved room temperature scanning tunneling microscopy images of carbon nanotubes were obtained, and actual values of the nanotube dimensions were estimated from a line profile fitting analysis. It was found that the cross sectional deformation induced by the van der Waals forces between the CNTs and the substrate is much smaller in the double-walled carbon nanotubes than in the single-walled nanotubes.


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