Ferroelectric domain engineering using atomic force microscopy tip arrays in the domain breakdown regime

Rosenwaks, Y.; Dahan, D.; Molotskii, M.; Rosenman, G.
January 2005
Applied Physics Letters;1/3/2005, Vol. 86 Issue 1, p012909
Academic Journal
One of the main obstacles to ultrahigh-density scanning probe ferroelectric-based devices is the writing speed of the device when using a single tip. We report here on the application of atomic force microscopy tip arrays for nanodomain engineering in ferroelectric crystals under the domain breakdown conditions. Using a multiple-tip array, it is shown that domain writing in 200-μm-thick RbTiOPO4 crystals results in a regular one-dimensional domain grating that penetrates throughout the bulk crystal as in the case of single tip writing. This multiple tip approach paves the way to the use of scanning probe microscopy for fabrication of various nanodomain configurations for advanced optoelectronic and microelectronic devices.


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