X-ray laser-induced photoelectron spectroscopy for single-state measurements

Nelson, A. J.; Dunn, J.; van Buuren, T.; Hunter, J.
December 2004
Applied Physics Letters;12/20/2004, Vol. 85 Issue 25, p6290
Academic Journal
We demonstrate single-shot x-ray laser-induced time-of-flight photoelectron spectroscopy on metal and semiconductor surfaces with picosecond time resolution. Our compact multipulse terawatt tabletop x-ray laser source provides the necessary high photon flux (>1012/pulse), monochromaticity, picosecond pulse duration, and coherence for probing ultrafast changes in the chemical and electronic structure of these materials. Static valence band and shallow core-level photoemission spectra are presented for ambient temperature polycrystalline Cu foils and Ge(100). Surface contamination was removed by UV ozone cleaning prior to analysis. The ultrafast nature of this technique lends itself to true single-state measurements of shocked and heated materials.


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