TITLE

Piezoresistive detection-based ferromagnetic resonance force microscopy of microfabricated exchange bias systems

AUTHOR(S)
Volodin, A.; Buntinx, D.; Brems, S.; Van Haesendonck, C.
PUB. DATE
December 2004
SOURCE
Applied Physics Letters;12/13/2004, Vol. 85 Issue 24, p5935
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Ferromagnetic resonance measurements were performed on CoO/Co exchange biased microstructures with a low-temperature magnetic resonance force microscope (MRFM). The MRFM instrument relies on piezoresistive force detection, and the magnetic tip attached to the cantilever acts as a field gradient source. These features extend the applicability of the MRFM that can also be used as a conventional magnetic force microscope. Spatial variations of the MRFM signal, which are induced by a spatially modulated exchange bias, are monitored with a lateral resolution of about 5 μm.
ACCESSION #
15331861

 

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