In situ observation of field emissions from an individual carbon nanotube by Lorenz microscopy

Fujieda, T.; Hidaka, K.; Hayashibara, M.; Kamino, T.; Matsumoto, H.; Ose, Y.; Abe, H.; Shimizu, T.; Tokumoto, H.
December 2004
Applied Physics Letters;12/6/2004, Vol. 85 Issue 23, p5739
Academic Journal
In situ observation of field emissions from an individual carbon nanotube (CNT) was performed by Lorenz microscopy. A bright spot appeared by Lorenz microscopy at the end of the CNT tip during field emission. The bright spot is assumed to be related to the emission site on the CNT. A drastic fluctuation was observed in the emission current above a few tens of microamperes, which was closely related to structural changes at the tip of the CNT. The layers of the CNT were peeled off and they worked as a second emission site by concentration of the electric field.


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