TITLE

Flicker (1/f) noise in the critical current of Josephson junctions at 0.09–4.2 K

AUTHOR(S)
Wellstood, F. C.; Urbina, C.; Clarke, John
PUB. DATE
November 2004
SOURCE
Applied Physics Letters;11/29/2004, Vol. 85 Issue 22, p5296
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We have measured the low-frequency noise in the critical current Ic of six dc superconducting quantum interference devices (SQUIDs) with resistively shunted Nb–NbOx–PbIn Josephson junctions in the temperature range T=0.09–4.2 K. Each device is voltage biased, the applied flux is an integer number of flux quanta, and the current fluctuations are measured with a second dc SQUID. At low frequencies f, there is a component of the power spectrum of the critical current fluctuations given approximately by SIc(f)=CIc2T2/Af, where A is the area of both junctions, and C≈(3.9±0.4)×10-23 m2/K2. For quantum bits based on Josephson junctions, the scaling of SIc(f) with T2 implies that the dephasing time limited by critical current l/f noise should scale as 1/T for temperatures down to at least 0.09 K.
ACCESSION #
15244140

 

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