High-resolution x-ray topography and diffraction study of bulk regular domain structures in LiNbO3 crystals

Antipov, V. V.; Blistanov, A. A.; Roshchupkina, E. D.; Tucoulou, R.; Ortega, L.; Roshchupkin, D. V.
November 2004
Applied Physics Letters;11/29/2004, Vol. 85 Issue 22, p5325
Academic Journal
Bulk regular domain structures created in a LiNbO3 crystal by aftergrowth thermoelectrical treatment technique were studied by high-resolution x-ray diffraction and topography. Topographic contrast can be observed between neighboring domains and is related to the difference in the direction of spontaneous polarization vectors. In the Y-cut case, x-ray topography allows the determination of positively or negatively charged domain boundaries. It is also shown that x-ray diffraction can be used to study elastic deformation around domain walls.


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