TITLE

Microstructure and composition of annealed Al/Ti-metallization layers

AUTHOR(S)
Hofmann, M.; Gemming, T.; Wetzig, K.
PUB. DATE
June 2004
SOURCE
Analytical & Bioanalytical Chemistry;Jun2004, Vol. 379 Issue 4, p547
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Al/Ti multilayers with columnar grains were deposited by electron-beam evaporation on piezoelectric LiNbO3 substrates. After annealing in air and under vacuum conditions dissolution of the Ti interlayer was observed for all samples. The original Ti interlayer dissolved completely and globular Al3Ti grains were formed within an Al matrix. All samples had an oxidized adhesive Ti bottom layer and a 10 nm thin Al layer below this adhesive Ti bottom layer, which remains intact after the applied heat treatment. This resistance against dissolution by interdiffusion could be caused by the oxidation. These changes in the microstructure and in the chemical composition were investigated by conventional and analytical TEM.
ACCESSION #
15125128

 

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