Probing subpicosecond dynamics using pulsed laser combined scanning tunneling microscopy

Aoyama, Osamu Takeuchi Masahiro; Oshima, Ryuji; Okada, Yoshitaka; Oigawa, Haruhiro; Sano, Nobuyuki; Shigekawa, Hidemi; Morita, Ryuji; Yamashita, Mikio
October 2004
Applied Physics Letters;10/11/2004, Vol. 85 Issue 15, p3268
Academic Journal
Time-resolved tunneling current measurement in the subpicosecond range was realized by ultrashort-pulse laser combined scanning tunneling microscopy, using the shaken-pulse-pair method. A low-temperature-grown GaNxAs1-x (x=0.36%) sample exhibited two ultrafast transient processes in the time-resolved tunnel current signal, whose lifetimes were determined to be 0.653±0.025 and 55.1±5.0 ps. These values are of the same order of magnitude as those measured in the conventional pump–probe reflectivity measurement.


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