TITLE

How well does total electron yield measure x-ray absorption in nanoparticles?

AUTHOR(S)
Fauth, K.
PUB. DATE
October 2004
SOURCE
Applied Physics Letters;10/11/2004, Vol. 85 Issue 15, p3271
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The possibility to quantitatively analyze total electron yield (TEY) spectra as a measure of the x-ray absorption cross section from supported magnetic nanoparticles is explored by a combination of experiments and Monte Carlo simulations. Unless the particles are very small, it is found that saturation effects are important and can lead to a severe underestimation of the magnetic moments, when the magneto-optical sum rules are straightforwardly applied to experimental data. However, unlike for planar samples the possibility to examine and correct the saturation effects by varying the x-ray angle of incidence is not given, the absorption profiles are largely unaffected in their shape. The Monte Carlo simulations, appropriately conducted for the material under investigation, provide an estimate of the saturation effects occurring in nanoparticle TEY data.
ACCESSION #
14909444

 

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