Size effect on Young’s modulus of thin chromium cantilevers

Nilsson, S.G.; Borrisé, X.; Montelius, L.
October 2004
Applied Physics Letters;10/18/2004, Vol. 85 Issue 16, p3555
Academic Journal
Thin chromium cantilevers with sub-100 nm thickness have been characterized by an atomic force microscope operating in contact mode. A continuous determination of the local mechanical properties at all lengths was accomplished by applying force along the length of the cantilevers. The result show a decrease of the Young’s modulus as the cantilevers get thinner.


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