Transmission electron microscopy and transistor characteristics of the same carbon nanotube

Meyer, Jannik C.; Obergfell, Dirk; Roth, Siegmar; Yang, Shihe; Yang, Shangfeng
October 2004
Applied Physics Letters;10/4/2004, Vol. 85 Issue 14, p2911
Academic Journal
A technique is presented which allows one to combine TEM investigations with transport measurements and potentially a wide range of other investigations on the same nanoobject. Using this technique, we have obtained high-resolution transmission electron microscopy images and transport investigations including transfer characteristics on the same single-walled carbon nanotube. The transfer characteristics show ambipolar transport. This observation is discussed taking into account TEM information on tube diameter, number of tubes in the bundle, and possible tube filling with fullerenes (peapods).


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