A hydrothermally deposited epitaxial lead titanate thin film on strontium ruthenium oxide bottom electrode

Morita, Takeshi; Cho, Yasuo
September 2004
Applied Physics Letters;9/20/2004, Vol. 85 Issue 12, p2331
Academic Journal
A lead titanate epitaxial thin film was obtained on a strontium ruthenium oxide bottom electrode by the hydrothermal method. The reaction temperature was 150°C more than 400 degrees lower than that of the conventional deposition processes. X-ray diffraction measurements revealed a c-axis of orientation. The single-crystal-like DE hysteresis curve showed a remanent polarization of 96.5 μC/cm2. The domain direction was controlled by an applied electric field using a metal-coated atomic force microcopy cantilever probe and the domain pattern was observed by scanning nonlinear dielectric microscopy. This investigation verified that this film did not contain an a-domain. In addition, no defects such as domain or grain boundaries were observed, even on the nanoscale.


Related Articles

  • Smallest 90° domains in epitaxial ferroelectric films. Vlooswijk, A. H. G.; Noheda, B.; Catalan, G.; Janssens, A.; Barcones, B.; Rijnders, G.; Blank, D. H. A.; Venkatesan, S.; Kooi, B.; de Hosson, J. T. M. // Applied Physics Letters;9/10/2007, Vol. 91 Issue 11, p112901 

    Periodic ferroelectric-ferroelastic 90° domain patterns with an unprecedented small domain periodicity of 27 nm were observed in thin PbTiO3 films grown on DyScO3 substrates. These patterns contain the narrowest possible a domains (6 nm wide) that allow to preserve the lateral coherence in...

  • Integration of Pb(Zr[sub 0.52]Ti[sub 0.48])O[sub 3] epilayers with Si by domain epitaxy. Sharma, A. K.; Sharma, A.K.; Narayan, J.; Jin, C.; Kvit, A.; Chattopadhyay, S.; Lee, C. // Applied Physics Letters;3/13/2000, Vol. 76 Issue 11 

    High-quality lead zirconate titanate films (PZT) have been grown on yttrium barium copper oxide (YBCO) bottom electrode by domain epitaxy where integral multiples of lattice constants match across the interface. The YBCO films were epitaxially fabricated on Si (100) by introducing epilayer...

  • Raman spectroscopy and x-ray diffraction of PbTiO3 thin film. Ching-Prado, E.; Reynés-Figueroa, A.; Katiyar, R. S.; Majumder, S. B.; Agrawal, D. C. // Journal of Applied Physics;8/1/1995, Vol. 78 Issue 3, p1920 

    Examines a lead-titanium-oxygen thin film prepared on silicon substrate by sol-gel technique. Application of micro-Raman spectroscopy and x-ray diffraction; Variations in the frequency and width of the Raman bands; Frequencies of the bands in different places on the film.

  • Preparation of c-axis oriented PbTiO3 thin films and their crystallographic, dielectric, and pyroelectric properties. Iijima, Kenji; Tomita, Yoshihiro; Takayama, Ryoichi; Ueda, Ichiro // Journal of Applied Physics;7/1/1986, Vol. 60 Issue 1, p361 

    Presents a study that examined the phase transition of lead-titanium-oxygen thin films by high-temperature x-ray diffraction. Polarization directions of the films in all specimens; Level of resistivity of the films; Detection of pyroelectric currents in all specimens.

  • X-ray diffraction studies of the epitaxy of a/b-axes oriented YBa2Cu3O7-δ films grown by liquid phase epitaxy. Sandiumenge, F.; Dubs, C.; Görnert, P.; Galí, S. // Journal of Applied Physics;5/15/1994, Vol. 75 Issue 10, p5243 

    Presents a study which explored an x-ray diffraction measurements of the epitaxy of a/b-axes oriented YBa[sub2]Cu[sub3]O[sub7-δ] films obtained by the liquid phase epitaxy technique. Background on the sample material; Description of the experimental setup; Results and discussion.

  • High-resolution x-ray study of thin GaN film on SiC. Kazimirov, A.; Faleev, N.; Temkin, H.; Bedzyk, M. J.; Dmitriev, V.; Melnik, Yu. // Journal of Applied Physics;6/1/2001, Vol. 89 Issue 11, p6092 

    The x-ray standing wave method (XSW) and high-resolution x-ray diffraction were used to study the structural perfection and polarity of GaN epitaxial thin film grown by hydride vapor phase epitaxy on the Si-face SiC substrate. The x-ray standing wave was generated inside the 300 nm thin film...

  • Structural phase transitions in nanosized ferroelectric barium strontium titanate films. Golovko, Yu.; Mukhortov, V.; Yuzyuk, Yu.; Janolin, P.; Dkhil, B. // Physics of the Solid State;Mar2008, Vol. 50 Issue 3, p485 

    The lattice parameters of epitaxial barium strontium titanate films with various thicknesses (from 6 to 960 nm) were measured as a function of temperature in the normal and tangential directions with respect to the film plane using x-ray diffraction. The films were grown through the...

  • Low-temperature in situ preparation of ferroelectric Pb(Zr[sub 0.55]Ti[sub 0.45])O[sub 3] thin.... Xingjiao Li; Jianshe Liu; Yike Zeng; Junwen Liang // Applied Physics Letters;10/25/1993, Vol. 63 Issue 17, p2345 

    Investigates the preparation of lead-zirconate-titanate thin films on platinum-coated (111)silicon by reactive sputtering technique. Reaction products identified by x-ray diffraction; Diffraction patterns of the films; Remanent polarization of the ferroelectric hysteresis loops.

  • Processing and electrical properties of Pb (ZrxTi1-x)O3 (x=0.2–0.75) films: Comparison of metallo-organic decomposition and sol-gel processes. Klee, M.; Eusemann, R.; Waser, R.; Brand, W.; van Hal, H. // Journal of Applied Physics;8/15/1992, Vol. 72 Issue 4, p1566 

    Presents a study that examined the deposition of thin lead zirconate titanate films by sol-gel and by metallo-organic decomposition processes. Methodology; Characterization of the thin films using x-ray diffraction and scanning electron microscopy; Analysis of the electrical characteristics of...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics