TITLE

Single-electron tunneling to insulator surfaces measured by frequency detection electrostatic force microscopy

AUTHOR(S)
Bussmann, E.; Kim, Dong Jun; WiIIiams, C. C.
PUB. DATE
September 2004
SOURCE
Applied Physics Letters;9/27/2004, Vol. 85 Issue 13, p2538
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Single-electron tunneling events between a metal probe and an insulator surface are measured by frequency detection electrostatic force microscopy. Single-electron tunneling events typically cause 1–10 Hz shifts in the 300 kHz resonance frequency of the oscillating force probe. The frequency shifts appear only within a sub-2 nm tip-sample gap and their magnitude is roughly uniform under fixed experimental conditions. An electrostatic model of the probe-sample system yields results consistent with the measurements.
ACCESSION #
14546609

 

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