Anisotropic dielectric properties in epitaxial Bi3.25La0.75Ti3O12 thin films along different crystal directions

Lee, Jang-Sik; Kang, B. S.; Lin, Y.; Li, Y.; Jia, Q. X.
September 2004
Applied Physics Letters;9/27/2004, Vol. 85 Issue 13, p2586
Academic Journal
Epitaxial (001)-oriented Bi3.25La0.75Ti3O12 (BLT) thin films were grown by pulsed-laser deposition on (001) LaAIO3 single-crystal substrates. The dielectric properties of the BLT films are highly anisotropic along different crystal directions. The dielectric constants are 358 and 160 along [100] and [110], respectively. Dielectric nonlinearity is also detected along these crystal directions. On the other hand, a much smaller dielectric constant and no detectable dielectric nonlinearity in a field range of 0–200 kV/cm are observed for a film along [001] where c-axis oriented SrRuO3 is used as the bottom electrode.


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