Nanoscale modification of electrical and magnetic properties of Fe3O4 thin film by atomic force microscopy lithography

Hirooka, Motoyuki; Tanaka, Hidekazu; Li, Runwei; Kawai, Tomoji
September 2004
Applied Physics Letters;9/6/2004, Vol. 85 Issue 10, p1811
Academic Journal
We present a report on the nanopatterning of an epitaxial ultrathin film of Fe3O4 with room-temperature (ferri)magnetism using atomic force microscopy (AFM). Fe3O4 thin films with atomically flat surfaces were grown using laser molecular-beam epitaxy on a MgAl2O4(111) single-crystal substrate. (Nanowire) were constructed on Fe3O4 thin film by applying an electric field between an AFM conductive tip and the surface of the film. The minimum width and height in the resulting nanowire are 48 nm and 2 nm, respectively. The patterned region of the Fe3O4 film surface possesses a resistance which is 105 times higher than the unpatterned region. Furthermore, magnetic force microscopy measurements also revealed that magnetization of the patterned region is strongly suppressed.


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