TITLE

Spectral content of NRZ test patterns

AUTHOR(S)
Redd, Justin; Lyon, Craig
PUB. DATE
September 2004
SOURCE
EDN;9/2/2004, Vol. 49 Issue 18, p67
SOURCE TYPE
Trade Publication
DOC. TYPE
Article
ABSTRACT
Many digital-communications systems use non-return-to-zero (NRZ) signaling, and system designers have created many NRZ test patterns to test and verify their products. These patterns usually either simulate actual data or stress certain aspects of the system. To understand the effects of the various test patterns on a system, it is important to understand the frequency characteristics of both the test pattern and the system under test. NRZ waveforms are inherently time-domain signals. NRZ-signaling systems assign a unique time slot of duration to each bit. The signal is either high, representing a one, or low, representing a zero, during the entire hit period. Each NRZ test pattern has an associated PSD (power spectral density) that indicates the frequency distribution of the pattern's signal power. The two primary methods of computing PSD are squaring the magnitude of the Eourier transform of the pattern or computing the Fourier transform of the autocorrelation function of the pattern. The first method is generally simpler.
ACCESSION #
14385576

 

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