Nanoscale deposition of solid inks via thermal dip pen nanolithography

Sheehan, P. E.; Whitman, L. J.; King, William P.; Nelson, Brent A.
August 2004
Applied Physics Letters;8/30/2004, Vol. 85 Issue 9, p1589
Academic Journal
We demonstrate that nanolithography can be performed using a heated atomic force microscope (AFM) cantilever tip to control the deposition of a solid organic “ink.” The ink, octadecylphosphonic acid (OPA), has a melting temperature near 100°C and can self-assemble on mica. Postdeposition analysis shows that deposition occurs only when the cantilever tip is heated above OPA’s melting temperature, that the deposited structure does not spread significantly while cooling, and that a cool tip coated with OPA does not contaminate the substrate during subsequent imaging. Single lines were written with a width of 100 nm. This approach greatly expands the potential of dip pen nanolithography, allowing local control of deposition and deposition of materials typically immobile at room temperature, while avoiding potential problems arising from inadvertent deposition and postdeposition diffusion.


Related Articles

  • Theoretical and experimental evidence for `true' atomic resolution under non-vacuum conditions. Sokolov, I. Yu.; Henderson, G. S. // Journal of Applied Physics;11/15/1999, Vol. 86 Issue 10, p5537 

    Presents a study which showed that the atomic force microscope is capable of imaging atomic features by presenting imaging of atomic scale defects in resolution. Development of the atomic force microscope; Results; Discussion; Conclusion.

  • An atomic force microscope tip designed to measure time-varying nanomechanical forces. Sahin, Ozgur; Magonov, Sergie; Chanmin Su; Quate, Calvin F.; Solgaard, Olav // Nature Nanotechnology;Aug2007, Vol. 2 Issue 8, p507 

    Tapping-mode atomic force microscopy (AFM), in which the vibrating tip periodically approaches, interacts and retracts from the sample surface, is the most common AFM imaging method. The tip experiences attractive and repulsive forces that depend on the chemical and mechanical properties of the...

  • Capturing and depositing one nanoobject at a time: Single particle dip-pen nanolithography. Wang, Ying; Zhang, Yi; Li, Bin; Lü, Junhong; Hu, Jun // Applied Physics Letters;3/26/2007, Vol. 90 Issue 13, p133102 

    A convenient technique for transferring nanoparticles in a one-particle-at-a-time fashion is presented. This technique, termed as single particle dip-pen nanolithography, employs an atomic force microscope (AFM) tip to “grab” individual gold nanoparticles on surfaces. The...

  • High speed atomic force microscope lithography driven by electrostatic interaction. Ding, Lei; Li, Yan; Chu, Haibin; Li, Changqing; Yang, Zhaohui; Zhou, Weiwei; Tang, Zi Kang // Applied Physics Letters;7/9/2007, Vol. 91 Issue 2, p023121 

    This letter paper describes a scanning probe lithography method for fabricating patterns of various nanoparticles on SiOx/Si substrate. The electrostatic interaction resulting from the charge separation caused by the friction between the atomic force microscope (AFM) tip and the substrate was...

  • Atomic force microscope lithography in perovskite manganite La0.8Ba0.2MnO3 films. Run-Wei Li; Kanki, Teruo; Tohyama, Hide-Aki; Jun Zhang; Tanaka, Hidekazu; Takagi, Akihiko; Matsumoto, Takuya; Kawai, Tomoji // Journal of Applied Physics;6/1/2004, Vol. 95 Issue 11, p7091 

    Atomic force microscopy (AFM) lithography has been investigated in La0.8Ba0.2MnO3 (LBMO) films. Unexpectedly, AFM lithography can be performed in LBMO film not only under a positive sample bias, but also under a negative sample bias. Under a positive sample bias voltage, grooves can be obtained...

  • Nanoscale lithography with frequency-modulation atomic force microscopy. Hamada, Masayuki; Eguchi, T.; Akiyama, K.; Hasegawa, Y. // Review of Scientific Instruments;Dec2008, Vol. 79 Issue 12, p123706 

    A lithographic method to draw nanoscale structures by repetitive depositions of the tip material by field evaporation has been developed based on frequency-modulation atomic force microscopy (FM-AFM). Because of high stiffness of quartz tuning forks, a force sensor in the AFM, unwanted...

  • Spin microscope based on optically detected magnetic resonance. Chernobrod, Boris M.; Berman, Gennady P. // Journal of Applied Physics;1/1/2005, Vol. 97 Issue 1, p014903 

    We propose a scanning magnetic microscope which has a photoluminescence nanoprobe implanted in the tip of an atomic force microscope, (AFM) scanning tunneling microscope (STM), or near-field scanning optical microscope, and exhibits optically detected magnetic resonance. The proposed spin...

  • Direct force measurements of biomolecular interactions by nanomechanical force gauge. Ki-Hun Jeong; Keller, Chris G.; Lee, Luke P. // Applied Physics Letters;5/9/2005, Vol. 86 Issue 19, p193901 

    Without using the laser and optical detection method of an atomic force microscope (AFM), direct force measurements of biomolecular interactions in biological solution are accomplished by a nanomechanical force gauge. The device consists of integrated nanoscale single-crystal Si cantilever and...

  • Publisher's Note: 'Nanoscale study of the current transport through transrotational NiSi/n-Si contacts by conductive atomic force microscopy' [Appl. Phys. Lett. 101, 261906 (2012)]. Alberti, Alessandra; Giannazzo, Filippo // Applied Physics Letters;1/21/2013, Vol. 102 Issue 3, p039901 

    A correction to the article "Nanoscale study of the current transport through transrotational NiSi/n-Si contacts by conductive atomic force microscopy" in the December 28, 2012 issue is presented.


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics