TITLE

Near-field polarimetric characterization of polymer crystallites

AUTHOR(S)
Goldner, Lori S.; Goldie, Scott N.; Fasolka, Michael J.; Renaldo, Francoise; Jeeseong Hwang; Douglas, Jack F.
PUB. DATE
August 2004
SOURCE
Applied Physics Letters;8/23/2004, Vol. 85 Issue 8, p1338
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We use near-field polarimetry (NFP) to investigate thin-film crystallites of isotactic polystyrene (iPS). NFP micrographs enable quantitative optical characterization of the birefringence in these specimens with subdiffraction-limited resolution, resulting in observations that give: (1) evidence for radial strain in the depletion boundary surrounding the growth front, and (2) a map of local tilt in the crystal axis and/or strain in the amorphous layers above and below the growth plane of the crystallites.
ACCESSION #
14154470

 

Related Articles

  • How to Measure Birefringence with Ellipsometry. Hilfiker, James // R&D Magazine;Jul2004, Vol. 46 Issue 7, p34 

    Presents the procedures for measuring birefringence with ellipsometry for research and development. Use of ellipsometry; Benefits of a birefringent effect.

  • Three linear probe polarization method in Mueller polarimetry with a source of arbitrary ellipticity. Savenkov, S. N.; Grygoruk, V. I.; Klimov, A. S.; Oberemok, Ye. A.; Skoblya, Yu. A. // Journal of Applied Spectroscopy;Nov2008, Vol. 75 Issue 6, p872 

    This is a study of the effect of the ellipticity of the polarization of radiation at the inlet of the shaping polarizer in the probe channel of a Mueller polarimeter operating with three linear probe polarizations on the accuracy with which the incomplete Mueller matrix is determined (without a...

  • polarimetry.  // Taber's Cyclopedic Medical Dictionary;2005, p1720 

    A definition of the term "polarimetry" is presented. It refers to measurement of the amount and rotation of polarized light.

  • Depolarization effects from nanoimprinted grating structures as measured by Mueller matrix polarimetry. Chen, Xiuguo; Zhang, Chuanwei; Liu, Shiyuan // Applied Physics Letters;10/7/2013, Vol. 103 Issue 15, p151605 

    Mueller matrix polarimetry (MMP) is introduced to characterize nanoimprinted grating structures, and noticeable depolarization effects from measured data are observed. We demonstrate that these depolarization effects are mainly induced by the finite bandwidth and numerical aperture of the...

  • Gate Spacer Width Monitoring Study with Scatterometry Based on Spectroscopic Ellipsometry. Vachellerie, V.; Kremer, S.; Elazami, A.; Morin, P.; Julien, C.; Duca, D.; Guiheux, D.; Bicais, N.; Pokrant, S. // AIP Conference Proceedings;2005, Vol. 788 Issue 1, p411 

    Critical Dimension (CD) control of Gate Spacers is key to achieve in well controlled implantations and a tight distribution of Vt for transistors on semiconductors devices. Presently, historical methods for CD control (top-down low-voltage Scanning Electron Microscopy, Atomic Force Microscopy,...

  • High-precision characterization of textured a-Si:H/SnO2:F structures by spectroscopic ellipsometry. Akagawa, Masataka; Fujiwara, Hiroyuki // Journal of Applied Physics;Oct2011, Vol. 110 Issue 7, p073518 

    Spectroscopic ellipsometry (SE) has been applied for the characterization of hydrogenated amorphous silicon (a-Si:H) layers formed on SnO2:F textured structures in an attempt to establish the structural characterization method for a-Si:H solar cells. In particular, an optical model that allows...

  • Photoinduced linear and/or circular birefringences from light propagation through amorphous or smectic azopolymer films. Pagès, S.; Lagugné-Labarthet, F.; Buffeteau, T.; Sourisseau, C. // Applied Physics B: Lasers & Optics;2002, Vol. 75 Issue 4/5, p541 

    The self-induced rotation of the azimuth of elliptically polarized light passing through birefringent azopolymer thin films is investigated. The experiments were carried out on thin films of the amorphous p(DR1M-co-MMA) and p(DR1M) azopolymer samples and of the p(6MAN) derivative in its glassy...

  • High-accuracy contactless method for determination of chemical composition of lithium niobate crystals by their birefringence. Atuchin, V. V.; Khasanov, T. // Optics & Spectroscopy;Aug2009, Vol. 107 Issue 2, p212 

    A high-accuracy method for determining the chemical composition of non-stoichiometric lithium niobate crystals is proposed based on precise measurements of birefringence of thin substrates using the laser ellipsometry in transmission. It is shown that, for compensators made of LiNbO3, this...

  • Imaging ellipsometry of graphene. Wurstbauer, Ulrich; Röling, Christian; Wurstbauer, Ursula; Wegscheider, Werner; Vaupel, Matthias; Thiesen, Peter H.; Weiss, Dieter // Applied Physics Letters;12/6/2010, Vol. 97 Issue 23, p231901 

    Imaging ellipsometry studies of graphene on SiO2/Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the...

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics