Infrared dielectric function and phonon modes of Mg-rich cubic Mgx Zn1-xO (x>=0.67) thin films on sapphire (0001)

Bundesmann, C.; Schubert, M.; Rahm, A.; Spemann, D.; Hochmuth, H.; Lorenz, M.; Grundmann, M.
August 2004
Applied Physics Letters;8/9/2004, Vol. 85 Issue 6, p905
Academic Journal
Infrared dielectric function spectra and phonon modes of single-phase rocksalt-type MgxZn1-xO thin films with 0.67≤x≤1 prepared by pulsed-laser deposition on c-plane sapphire substrates were obtained from infrared spectroscopic ellipsometry (360 cm-1 to 1500 cm-1). A one-mode behavior is found. Phonon mode frequencies, the high-frequency limit of the dielectric function, and phonon mode broadening parameters reflect a considerable and systematic dependence on the Mg content x. X-ray diffraction measurements revealed the single-phase growth and a decreasing lattice constant with increasing x.


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