Spectroscopic ellipsometric analysis of interfaces: Comparison of alloy and effective-medium-approximation approaches to a CdMgTe multilayer system

Ghong, T. H.; Kim, T. J.; Kim, Y. D.; Aspnes, D. E.
August 2004
Applied Physics Letters;8/9/2004, Vol. 85 Issue 6, p946
Academic Journal
We discuss the accuracy and detectability of interface layers in the analysis of ellipsometric spectra in the CdxMg1-xTe system. Using parametric-alloy and effective-medium-approximation (EMA) representations to simulate interfaces in a single-quantum-well structure, we show that EMA analysis overestimates thicknesses of alloy interfaces by more than a factor of 3. While detailed results will clearly depend on the nature of the epitaxial materials involved, the results suggest that analyses of interfaces by the EMA should be done with caution.


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