Field-dependent charge carrier dynamics in GaN: Excitonic effects

J. van de Lagemaat; Vanmaekelbergh, D.; Kelly, J. J.
August 2004
Applied Physics Letters;8/9/2004, Vol. 85 Issue 6, p958
Academic Journal
The electric-field dependence of the charge-carrier dynamics in GaN was studied by measuring excitation spectra of the sub-band-gap (yellow) luminescence as a function of bias using a Schottky junction formed at the interface between the semiconductor and an electrolyte solution. At large bias, the contribution of free electrons and holes to the photoluminescence is significantly reduced due to the dead-layer effect. As a result, striking features are revealed in the spectra close to the fundamental absorption. These features are attributed to exciton decay via yellow luminescence centers.


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