Increase of free carrier lifetime in nonpolar a-plane GaN grown by epitaxial lateral overgrowth

Juršènas, S.; Kuokštis, E.; Miasojedovas, S.; Kurilcik, G.; Zukauskas, A.; Chen, C. Q.; Yang, J. W.; Adivarahan, V.; Khan, M. Asif
August 2004
Applied Physics Letters;8/2/2004, Vol. 85 Issue 5, p771
Academic Journal
Carrier recombination dynamics in epitaxial a-plane GaN and fully coalesced epitaxial laterally overgrown (ELOG) a-plane GaN films has been studied by means of time-resolved photoluminescence under high photoexcitation. The results were compared with conventional c-plane GaN films grown under similar conditions. In a-plane GaN epilayers, the total efficiency of electron-hole plasma spontaneous luminescence decreases 20 times, whereas the luminescence decay time reduces from τLU=42 to τLU≤10 ps in comparison with c-plane GaN films. Meanwhile, an essential increase in total emission efficiency (by more than two orders of magnitude) and an increase of the decay time up to τLU=430 ps have been observed for an ELOG a-plane sample in comparison with a-plane GaN films. This confirms a significant reduction of the nonradiative recombination rate for nonequilibrium carriers. Assuming a saturation of the nonradiative deep-level transitions, the room-temperature free-carrier lifetime of τ=910 ps for ELOG a-plane GaN sample was obtained, which indicates on an excellent quality of the a-plane ELOG GaN films.


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