Strain analysis in ultrathin silicide layers in Fe/CsCl–57FeSi/Fe sandwiches

Croonenborghs, B.; Almeida, F. M.; Cottenier, S.; Rots, M.; Vantomme, A.; Meersschaut, J.
July 2004
Applied Physics Letters;7/12/2004, Vol. 85 Issue 2, p200
Academic Journal
Epitaxially stabilized iron monosilicide films with the CsCl structure (B2-FeSi) have been investigated by conversion electron Mössbauer spectroscopy and x-ray diffraction. A detailed investigation of the elastic strain in these metastable layers is presented. Using hyperfine interaction information the tetragonal distortion of the silicide lattice could be quantified for layers as thin as 14 Å. A general tendency for strain relaxation with increasing layer thickness is observed.


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