TITLE

Spatially-resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy

AUTHOR(S)
Pingree, L. S. C.; Hersam, M. C.; Kern, M. M.; Scott, B. J.; Marks, T. J.
PUB. DATE
July 2004
SOURCE
Applied Physics Letters;7/12/2004, Vol. 85 Issue 2, p344
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A conductive atomic force microscopy (cAFM) technique has been developed that concurrently monitors topography, charge transport, and electroluminescence. This cAFM approach is particularly well suited for probing the electroluminescent response characteristics of operating organic light-emitting diodes (OLEDs) over short length scales. In a typical experiment, charge is injected into individual OLED structures with the cAFM tip, and the resulting electroluminescence and current are measured with collecting optics and a variable gain photomultiplier tube. As a proof of principle, the real-time spatial and temporal current–voltage and electroluminescence–voltage properties of 8 μm×8 μm OLED pixels are simultaneously imaged.
ACCESSION #
13719736

 

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