Spatially-resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy

Pingree, L. S. C.; Hersam, M. C.; Kern, M. M.; Scott, B. J.; Marks, T. J.
July 2004
Applied Physics Letters;7/12/2004, Vol. 85 Issue 2, p344
Academic Journal
A conductive atomic force microscopy (cAFM) technique has been developed that concurrently monitors topography, charge transport, and electroluminescence. This cAFM approach is particularly well suited for probing the electroluminescent response characteristics of operating organic light-emitting diodes (OLEDs) over short length scales. In a typical experiment, charge is injected into individual OLED structures with the cAFM tip, and the resulting electroluminescence and current are measured with collecting optics and a variable gain photomultiplier tube. As a proof of principle, the real-time spatial and temporal current–voltage and electroluminescence–voltage properties of 8 μm×8 μm OLED pixels are simultaneously imaged.


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