TITLE

Effect of operating temperature and film thickness on the pyroelectric response of ferroelectric materials

AUTHOR(S)
Sharma, A.; Ban, Z.-G.; Alpay, S. P.; Mantese, J. V.
PUB. DATE
June 2004
SOURCE
Applied Physics Letters;6/14/2004, Vol. 84 Issue 24, p4959
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The influence of the operating temperature and film thickness on the pyroelectric properties of (001) Ba0.6Sr0.4TiO3 (BST 60/40) epitaxial films on (001) LaAlO3, MgO, and Si substrates is investigated theoretically via a thermodynamic model. The results are presented using contour maps that can be used to identify “design windows” for film thickness and operating temperature for optimum pyroelectric response. For BST 60/40 on LAO and MgO large pyroelectric coefficients (∼0.7 μC cm-2 K-1) are observed at near room temperature for moderate film thickness (50–200 nm). The pyroresponse of films on Si is suppressed by two orders of magnitude compared to bulk BST 60/40 due to internal stresses. Significant recovery in the pyroelectric coefficient on Si is expected for lower growth temperatures due to the reduction of thermal stresses. © 2004 American Institute of Physics.
ACCESSION #
13269842

 

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