TITLE

Position noise in scanning superconducting quantum interference device microscopy

AUTHOR(S)
Lee, Su-Young; Matthews, J.; Wellstood, F. C.
PUB. DATE
June 2004
SOURCE
Applied Physics Letters;6/14/2004, Vol. 84 Issue 24, p5001
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Experimentally obtained magnetic field images contain not only magnetic field noise, but also uncertainty in the position at which the data points are recorded. Such position noise degrades the images where the magnetic field gradients are strongest. Our high-Tc scanning superconducting quantum interference device (SQUID) microscope was found to be limited by a position noise of about 0.145 μm. For a straight wire carrying 500 μA with a rms magnetic noise of 0.185 nT, and source–sample separation 150 μm, we find that the rms position noise must be less than 62 nm for it to have less impact on the image quality than intrinsic magnetic SQUID noise. © 2004 American Institute of Physics.
ACCESSION #
13269828

 

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