TITLE

Quantitative microwave evanescent microscopy of dielectric thin films using a recursive image charge approach

AUTHOR(S)
Chen Gao; Bo Hu; Pu Zhang; Mengming Huang; Wenhan Liu; Takeuchi, I.
PUB. DATE
June 2004
SOURCE
Applied Physics Letters;6/7/2004, Vol. 84 Issue 23, p4647
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A recursive image charge approach has been successfully developed for quantitative microwave microscopy of dielectric thin films using the scanning evanescent microwave microscope. With this approach and the recursion-to-circulation algorithm, frequency shift of the microscope as functions of the thickness of the film, dielectric constants of the film and the substrate can be efficiently computed in a circulation way. © 2004 American Institute of Physics.
ACCESSION #
13203737

 

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