TITLE

Terahertz emission by InN

AUTHOR(S)
Ascazubi, Ricardo; Wilke, Ingrid; Denniston, Kyle; Hai Lu; Schaff, William J.
PUB. DATE
June 2004
SOURCE
Applied Physics Letters;6/7/2004, Vol. 84 Issue 23, p4810
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We report on optically excited terahertz (THz) emission by indium nitride (InN) thin films. We have used 70 fs titanium–sapphire laser pulses with wavelengths at 800 nm to generate THz-radiation pulses. The InN thin films are deposited on sapphire substrates with GaN buffer layer by molecular-beam epitaxy. The THz-radiation emitted from the InN surface is significantly stronger than that of the GaN/InN interface. The origin of the THz emission are transient photocarrier currents. These results are in agreement with recent experimental results of InN which show that this material is a small band-gap semiconductor. The magnitude of the THz emission from the InN is strong compared to THz emission from previously investigated semiconductors. © 2004 American Institute of Physics.
ACCESSION #
13203682

 

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