Temperature-dependent emptying of grain-boundary charge traps in chemical vapor deposited diamond

Hearne, S. M.; Jamieson, D. N.; Trajkov, E.; Prawer, S.; Butler, J. E.
May 2004
Applied Physics Letters;5/31/2004, Vol. 84 Issue 22, p4493
Academic Journal
We have used the technique of ion beam induced charge with a 2 MeV He+ microprobe to image particle detectors fabricated from polycrystalline chemical vapor deposited diamond as a function of temperature. We find that detectors which display a thermally stimulated current peak at 190 °C display increased charge collection efficiency when heated above that temperature. The probability of detecting the impact of a single ion at room temperature was less than 2%, but this probability rises to over 80% at 170 °C. We model this effect by showing that charge trapped at grain boundaries is liberated at elevated temperatures and this results in an increased electric field within the detector volume and hence a raised charge collection efficiency. © 2004 American Institute of Physics.


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