TITLE

Microstructures formed in recrystallized Si

AUTHOR(S)
Watanabe, K.; Anzai, Y.; Nakanishi, N.; Yamazaki, T.; Kuramochi, K.; Mitsuishi, K.; Furuya, K.; Hashimoto, I.
PUB. DATE
May 2004
SOURCE
Applied Physics Letters;5/31/2004, Vol. 84 Issue 22, p4520
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Our study using systematic transmission electron microscopy observation and simulation shows that microstructures formed in recrystallized Si are characterized as microtwin or lamellar microtwin. Detailed analysis leads to their atomic structures. The discovery of exceptional diffraction spots offers direct evidence of long-periodic-order structures and antiphase boundaries, due to the ordering of projected lamellar microtwins. © 2004 American Institute of Physics.
ACCESSION #
13154676

 

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