High-energy x-ray scattering in grazing incidence from nanometer-scale oxide wires

Sakata, Osami; Takata, Masaki; Suematsu, Hiroyoshi; Matsuda, Akifumi; Akiba, Shusaku; Sasaki, Atsushi; Yoshimoto, Mamoru
May 2004
Applied Physics Letters;5/24/2004, Vol. 84 Issue 21, p4239
Academic Journal
A method has been developed for analyzing the structure of crystalline nanowires deposited on a crystal surface. It combined in-air grazing-incidence surface scattering with high-energy synchrotron x-ray scattering. The technique has allowed a direct reciprocal-lattice space mapping of the x-ray intensities scattered from ultrathin nanowires. Using this method, the sheet-shape diffraction emanating from ultrathin NiO wires was observed. The average nanowire–nanowire distance of 46 nm and a crystallographic domain size of approximately 7.5 nm across the nanowire were evaluated. © 2004 American Institute of Physics.


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