TITLE

Evaluation of manganite films on silicon for uncooled bolometric applications

AUTHOR(S)
Choudhary, R.J.; Ogale, Anjali S.; Shinde, S.R.; Hullavarad, S.; Ogale, S.B.; Venkatesan, T.; Bathe, R.N.; Patil, S.I.; Kumar, Ravi
PUB. DATE
May 2004
SOURCE
Applied Physics Letters;5/10/2004, Vol. 84 Issue 19, p3846
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Pulsed-laser-deposited polycrystalline/amorphous films of mixed-valent manganites [La0.7Ca0.3MnO3 (LCMO), La0.5Sr0.5MnO3 (LSMO), La0.5Ba0.5MnO3 (LBMO), and (La0.6Pr0.4)0.67Ca0.33MnO3 (LPCMO)] grown at low temperature (450 °C) on single crystal (001) silicon substrate are evaluated for uncooled bolometric applications. It is shown that the temperature coefficient of resistance (TCR) and electrical noise (Sυ) depend on the chemical composition. The optimum performance is found for LCMO with TCR of ∼7% K-1 and spectral noise ∼8.9 × 10-13 V²/Hz. In LBMO and LSMO the noise is much lower, but so is the TCR (1.5%-2% K-1). In LPCMO the TCR is high (∼10% K-1) and the noise is as well.
ACCESSION #
13029141

 

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