Interface mixing and phase transformations in Xe-ion-irradiated Co/Fe bilayers

Zhang, K.; Gupta, R.; Müller, G.A.; Schaaf, P.; Lieb, K.P.
May 2004
Applied Physics Letters;5/10/2004, Vol. 84 Issue 19, p3915
Academic Journal
Bilayers of polycrystalline Co(37 nm)/Fe(37 nm) were deposited onto Si wafers via electron-gun evaporation and irradiated at room temperature with 200 kev Xe+ ions to fluences of 5 × 1014-1 × 1016/cm². The magneto-optical Kerr effect, Rutherford backscattering spectroscopy and x-ray diffraction were used to characterize the magnetization and microstructure of the films. Xe fluences of up to 5 × 1015 ions/cm² were found to induce a four-fold magnetic anisotropy in the originally isotropic films, as a consequence of the phase transformation of hexagonal Co to face-centered-cubic Co caused by ion irradiation. Xe fluences exceeding 7 × 1015 ions/cm² produced a uniaxial magnetic texture, which is explained by strong Co/Fe interface mixing and possibly ion-induced formation of CoFe grains at the interface.


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